| Customization: | Available |
|---|---|
| Reverse Recovery Current: | 0~1000 Ma |
| Forward Current: | 0~1000 Ma |
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The DI-1nS-FRD series Diode Reverse Recovery Time Tester is the fourth-generation product developed by our company. The core components, such as the FPGA chip and threshold comparator, are equipped with temperature-controlled technology, which greatly enhances both the testing accuracy and stability. This series of testers features a touch-screen LCD display, allowing users to set maximum and minimum recovery times, as well as the rise and fall trigger settings. It also displays the reverse recovery time of the diode, with a PASS indicator showing whether the tested diode meets the required standards. This series is widely used in diode testing systems, industrial production systems, and electronics laboratories.
The DI-1nS-FRD is specifically designed for testing the reverse recovery time of fast recovery diodes (FRDs) with a recovery time of less than 1000nS and Schottky diodes, with an accuracy of 0.1nS. In addition to traditional continuous constant current pulse testing, it also supports pulse constant current testing. In this mode, the diode PN junction temperature does not rise, ensuring that the test values remain stable and unaffected.
| Parameter | Value | Unit | Remarks |
|---|---|---|---|
| Forward Current | 0~500 mA | mA | Continuous mode |
| Reverse Recovery Current | 0~1000 mA | mA | Continuous mode |
| Forward Current | 0~1000 mA | mA | Pulse mode |
| Reverse Recovery Current | 0~2000 mA | mA | Pulse mode |
| Diode Forward Voltage (Vf) | 0~13 V | V | |
| Reverse Voltage | 0~30 V | V | |
| Recovery Time Test Range | 0~999.9 nS | nS | |
| Pulse Signal Edge Speed (tf) | <1 | nS |
This version includes both continuous and pulse current testing modes, providing more flexible and reliable testing options for diodes.
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