1n4148 Series High-Speed Diode Reverse Recovery Time Tester

Product Details
Customization: Available
Customized: Customized
Measurement Accuracy: 0.1 Ns
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Basic Info.

Model NO.
DI-1nS
Test Range
≤ 350Tns
Test Pulse Rise Time (TF)
700TPS
Reverse Voltage
0 ~ 7 V Typically 6V
Forward Current
10 Ma Adjustable
Test Frequency
20 Hz Pulse Trigger Input
Specification
Reverse Recovery Current (Ir): ≤ 60 mA
Origin
China

Product Description

Overview

The DI-1nS is designed for testing signal diodes with reverse recovery times shorter than 350ns, offering an impressive accuracy of 0.1ns. It excels particularly in testing high-speed signal diodes with reverse recovery times below 6ns. The instrument features both constant current and pulse constant current modes, ensuring stable and reliable reverse recovery time testing.

Applications

  • High-speed signal diodes

Measurement Principle

The DI-1nS system includes components such as a falling edge trigger generator module, adjustable power supply, high-speed comparator, and FPGA testing module. The amplitude of the falling edge pulse can be adjusted via the VR potentiometer, which in turn adjusts the diode's reverse recovery current. By adjusting the voltage amplitude of Vadj, the forward current IF can be varied.

The system uses a 76.5-ohm and a 23.5-ohm resistor pair to form a 100-ohm load, with the falling and rising edge times evaluated across the 23.5-ohm resistor. This resistor offers a higher time constant compared to the 50-ohm resistor, resulting in twice the measurement accuracy. The high-speed comparator and FPGA module are integrated with an adjustable threshold, capable of independent falling and rising edge triggers. The digital display shows the Trr (reverse recovery time) value, eliminating the need for an oscilloscope, thus lowering the cost and simplifying operation.

The system also features both continuous constant current and pulse working modes. In continuous mode, the diode's PN junction temperature gradually increases, and the reverse recovery time changes accordingly. In pulse mode, the temperature remains constant at room temperature, ensuring stable and consistent test results.

Parameters

Type Value Unit Remarks
Reverse Recovery Current (Ir) ≤ 60 mA  
Reverse Voltage 0 ~ 7 V Typically 6V
Measurement Accuracy 0.1 ns  
Test Range ≤ 350 ns  
Forward Current 10 mA Adjustable
Test Frequency 20 Hz Pulse trigger input
Test Pulse Rise Time (Tf) 700 ps  
1n4148 Series High-Speed Diode Reverse Recovery Time Tester

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